Short Course Introduction

Space Radiation Environment and Total Ionizing Dose

Christoph Tscherne, Seibersdorf Laboratories
Radiation Hardness Assurance Expert

>> to the Abstract

Single-Event Effects – Basic Mechanisms and Testing of Complex Devices

Indranil Chatterjee, Airbus Defence and Space
Space Electronics Reliability Expert

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10:40

COFFEE BREAK

Overview of ESA Cubesat Missions and Radiation Testing on Cubesat Electronics

Franco Perez, European Space Agency, ESA

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Q&A

Coordinated by the Session Co-Chair

12:30

Short Course LUNCH

Laser Testing for Single-Event Effects: Basics and use cases

Vincent Pouget, IES, CNRS, University of Montpellier

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14:45

BREAK

Design and Testing of TID and SEE Radiation Hardened CMOS ASICs

Paul Leroux, Katholieke Universiteit Leuven
Professor in radiation hardened micro-electronics

Jeffrey Prinzie, Katholieke Universiteit Leuven
Electronic Circuits and Systems

>> to the Abstracts

Q&A

Coordinated by the Session Co-Chair

END of Short Course

Short Course Exam (30 min)

Coordinated by the Session Co-Chair