Single Event Effect (SEE) Testing

Ionizing Radiation and Radioactivity

Single Event Effect (SEE) Testing

At Seibersdorf Laboratories, we offer advanced Single Event Effect (SEE) testing services to evaluate the susceptibility of electronic components to radiation-induced single event effects. Our comprehensive SEE testing solutions are designed to meet the stringent requirements of various industries, including aerospace, defense, and semiconductor manufacturing.

In-house test preparation

We pride ourselves on our ability to perform all aspects of test preparation in-house, including the development of custom test setups tailored to the specific requirements of each test scenario. Our experienced team works closely with clients to ensure that test protocols are optimized for accuracy and reliability.


Leveraging Partner Facilities

For the actual testing phase, we utilize beam time from partner facilities equipped with heavy ion irradiation capabilities. This strategic partnership gives us access to state-of-the-art equipment and resources necessary to perform accurate SEE testing with heavy ions of various Linear Energy Transfer (LET) values.

State of the Art SEE Detection Systems

We utilize state-of-the-art SEE detection systems based on an FPGA architecture that provide real-time detection of events on a nanosecond timescale. Our detection system is highly customizable, with both hardware and software configurations tailored to each customer's specific requirements.


Standards Compliance

Our SEE test procedures adhere to industry-standard guidelines to ensure the accuracy and reliability of our results. We follow relevant standards such as

  • ESCC Basic Specification No. 25100 for Single Event Effects Test Methods and Guidelines.
  • EIA/JEDEC Standards EIA/JES57 and JEDEC Standards JESD89 for Measuring and Reporting Single-Event Effects in Semiconductor Devices.
  • MIL-STD-750 Procedure 1080 for Single-Event Burnout and Single-Event Gate Rupture.


Comprehensive test solutions

Whether evaluating single-event effects in semiconductor devices or assessing the vulnerability of complex systems, we provide comprehensive testing solutions tailored to meet our customers' specific needs. Our goal is to provide accurate and actionable data to support informed decision-making and improve the reliability of electronic components in radiation-rich environments.

Our SEE Test Services

In-House Test Preparation

  • Customized test setups developed in-house to meet specific client requirements.
  • Experienced team ensures thorough preparation for accurate testing.

Utilization of Partner Facilities

  • Access to partner facilities with heavy ion and proton irradiation capabilities.
  • Strategic partnerships ensure access to state-of-the-art equipment for precise testing.

SEE Laser Testing

  • In-house SEE testing with a pulsed laser source
  • Precise and controlled method for evaluating device reliability
  • Provides high accessibility and immediate results
  • Fast turnaround and development times

Adherence to Standards

  • Compliance with industry standards including ESCC 25100 and EIA/JEDEC Standard EIA/JES57 for single event effect testing
  • Adherence to relevant standards for single event burnout and single event gate rupture testing, such as MIL STD 750 procedure 1080

Comprehensive Testing Solutions

  • Assessment of radiation effects on individual components or complex systems.
  • Tailored testing solutions to meet specific client needs.
  • Delivery of accurate and actionable data to support informed decision-making.

At Seibersdorf Laboratories, you can rely on our expertise and commitment to excellence in SEE testing to protect the integrity and performance of your electronic components against the challenges of single event effects induced by radiation exposure.