Michael Wind, Peter Beck, Marcin Latocha, Christoph Tscherne
Seibersdorf Laboratories, Austria
Semiconductor devices are pervasively deployed in analog and digital applications for earth and space due to being cheap, small, fast, light weighted, and offering high functionality. When exposed to ionizing radiation semiconductor devices are vulnerable to a variety of damaging mechanisms. Effects due to radiation have been observed and investigated for many decades by now and a lot of insight into the phenomena has been gathered and documented in literature (e.g.  - ). This presentation intends to give an overview on the major types of radiation effects, i.e. Total Ionizing Dose (TID), Single Event Effects (SEE) and Total Non-Ionizing Dose (TNID) effects. The basic radiation effects are illustrated that occur in electronics when they are exposed to the different radiation sources. Semiconductor parts being scheduled for operation in a radiation environment, e.g. satellite’s electronics, require a decent knowledge on their susceptibility to the present radiation environment which raises the need for radiation tests. To assure the significance of such test and the comparability of the results testing is typically performed according to standards (e.g.  - ). Basic information on test procedures and available test standards is given.
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