RADHARD 2017

Radiation Hardness Assurance

Fast Real Time Assessment and Characterisation of Transients

 

M. Wind, P. Beck, M. Latocha, C. Tscherne
Seibersdorf Labor GmbH, Austria

Abstract

The characterisation of short transients requires a markedly fast test system being capable of monitoring the device output lines with a time resolution of less than a nano second. The occurrence of the transient is recorded and the transient is analysed in real-time with respect to several properties such as the time of the transient occurrence, the duration of the transient, the transient amplitude, etc. Additionally the shape of the transient is recorded by logging the time evolution of the DUT output signal with a time resolution of less than a nano second. All data are evaluated and stored in real time assuring that no transient event is missed.
The SET detection system used for this purpose is based on the National Instruments PXI (PCI extensions for Instrumentation) standard that offers a measurement infrastructure being quick enough for this challenging task. The systems consists of a PXIe-1085 express chassis having 18 slots that is adopting a PXIe-8135 controller. The system is capable of performing high speed data transfer at a rate of 3.2 GB/s within the PXI system. One of the system slots is equipped with a NI 5771 that is an 8-bit Oscilloscope Digitizer adapter for NI FlexRIO. This digitizer has a bandwidth of 3 G samples/s and thus is consequently quick enough to capture, analyse and store transients during a time span within the nanosecond regime.