Radiation Effects from the Perspective of Analog IC Designer – Radiation-Hard-by-Design
Alicja Michalowska-Forsyth, Varvara Bezhenova
Graz University of Technology, Institute of Electronics, Graz, Austria
Abstract
In space-borne, medical and high energy physics applications, the heart of a measurement system is usually an Integrated Circuit (IC). More and more often Application-Specific Integrated Circuits (ASICs) are used instead of fromthe-shelve products: ASIC offers lower power consumption than a standard IC or a discrete solution; also, higher measurement precision can be achieved, thanks to small capacitances and high speed, combined with a customized architecture.
This talk focuses on Total Ionizing Dose (TID) effects on integrated circuits (IC) and prospects for their mitigation through Radiation-Hard-by-Design (RHBD) techniques. It also discusses the radiation-hardened ASIC design flow, in particular emphasizing the issues of efficient irradiation tests and characterization of the integrated test structures.
References
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V. Bezhenova, “Total Ionizing Dose Effects on CMOS Ring Oscillators”, MSc Thesis, Graz University of Technology, 2015
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Acknowledgements
The authors gratefully acknowledge the support of research projects at the Institute of Electronics by: The Austrian Science Fund (FWF), The Austrian Research Promotion Agency (FFG) and ams AG.