How to use sensitivity analysis for EMI screening in LTspice

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Ko Odtreitz, Bernd Deutschmann
Graz University of Technology / Institute of Electronics

Poster-Abstract

This poster provides a step-by-step guide on using Morris sensitivity analysis to identify key contributors to EMI in circuit simulations. The Morris method efficiently quantifies the impact of multiple component values on conducted emissions while keeping the number of required simulations low. By applying this approach to a power converter circuit, we rank the dominant EMI contributors across different frequency ranges. Additionally, we outline best practices and highlight the method's advantages and limitations.

This poster builds on our previous research presented at EMC Europe Paris and offers practical guidance for integrating sensitivity analysis into EMC workflows.