Laser SEE testing with SEREEL2
Richard Sharp 1
1 Radtest Ltd, 168 Maxwell Avenue, Harwell, OX11 0QT, United Kingdom
For at least two decades, interest has grown in SEE testing methodologies that are alternatives to particle beams from large accelerators. Perhaps the most widespread of these is the use of pulsed lasers to deposit similar amounts of charge in a comparable timeframe and in the same place as a cosmic ray. What were once complex, research laboratory-based systems have become smaller, cheaper and easier to use as tools for routine testing. There are distinct advantages and disadvantages of using pulsed lasers for SEE testing, which will be outlined today, but their benefits in terms of flexibility and time make them a very attractive option in certain circumstances.
SEREEL2 is a second-generation laser SEE test system, based upon the latest and most reliable components. Only very stable, reliable, industrial laser sources are used. These can run for months without any need for tuning. Combined with a similar quality optical parametric analyser (OPA), this extends the capability of the system from silicon alone to the entire family of WBG materials. Modern movement stages are precise, repeatable and reliable, enabling semi-automated screening of large numbers of samples.
The presentation will highlight these benefits of SEREEL2, illustrated by examples of where the quality and reliability of the instrument pushes radiation testing into areas simply not feasible with accelerator sources.
I would like to acknowledge the work on the original SEREEL done by Andrew Chugg, Rod Jones and others at MBDA UK Ltd.