Radiation Hardness Assurance


COTS components in space projects: motivations and challenges

Dave Hiemstra 1, Li Chen 2

1 MDA, Brampton, Canada
2 University of Saskatchewan, Saskatoon, Canada



Pulsed lasers have been an effective tool in simulating single event effects in integrated circuits (IC). It can be used to estimate the SEU sensitivity of the ICs and is especially useful in diagnosing the location of single event latchup. Two-photon lasers have gained more attention during recently years since it has longer wavelength to penetrate the substrate of the ICs from the back of the ICs and better control on the focus regions.

The conventional stage-scan lasers have drawbacks due to the mechanical movement of the stage. The advanced laser-scan techniques can move the laser beams instead of the stage, which makes the scanning process much faster and more accurate. On top of that, the precise temperature control of the device-under-test (DUT) and fine step scanning are other important properties for laser setup.

The laser facility at the University of Saskatchewan is been upgrading to accommodate those issues to achieve more accurate and faster laser testing. The laser source includes both 1064nm and 1250nm for testing, and it also can achieve precise temperature control on the DUT and anti-vibration mechanism. The laser has been used for a number of test campaigns including both analog and digital ICs. The digital circuits include: custom-designed flip-flop chains, FPGAs, and memories. The analog/mixed signal circuits include: DC-DC converter controllers, Hall effects sensors, and op amps have been tested with this facility.