Radiation Hardness Assurance

STREAM: Smart Sensor Solutions Design and Testing


T. Vincenzi1,2, F. Segmanovic1,3
1ams AG; 2Technische Universität Graz; 3University of Zagreb


In the scope of Horizon 2020 in Innovation and Research, this work is part of the ITN Project “Smart Sensor Technologies and Training for Radiation Enhanced Applications and Measurements” (STREAM). STREAM aims at the design, construction and manufacturing of smart-sensor solutions. In particular, the detectors for X-ray and CT imaging comprise a conversion stage for converting the X-ray quanta ultimately into electrical signals. In the majority of today’s detectors for dynamic X-ray imaging and CT imaging, the conversion is indirect. There are many parameters that affect the performance of imaging detectors: detection efficiency, spectral responsivity, signal-to-noise ratio and cross-talk are some of the most important.

Moreover, for the development of full sensor solutions, radiation hard digital and analog IPs have to be investigated. In particular, Non-Volatile Memories (NVM) are a key component. The Sidewall Spacer Memory Bit Cell [1] is a promising element compared to state-of-the-art, as it allows no mask addition in the process and has a promising endurance performance.


[1] Breitwisch, Matthew J., inventor; Chen, Bomy A., inventor; Lam, Chung H., inventor; International Business Machines Corp, assignee. Embedded one-time programmable non-volatile memory using prompt shift device. U.S. Patent 6518614B1. February 11, 2003.