# Continuous Development

## ELDRS – An Experimental Survey

ELDRS (enhanced low dose rate sensitivity) of electronic components is important for component operation in a low dose rate field, e.g. for satellites. Low dose rates and high total dose levels need long test duration and create high testing costs. An accelerated testing method using switching of high and low dose rates has been investigated. Statistical analysis has been performed to decrease test sample size.

Reference and Web-Link: Wind, M., Beck, P.; Boch, J.; Dusseau, L.; Latocha, M.; Poizat, M.; Zadeh, A., Applicability of the Accelerated Switching Test Method - A Comprehensive Survey, Radiation Effects Data Workshop (REDW), 2011.
http://eldrs.net